Despite its standardization as IEEE 1149.1 in 1990 and wide use in the industry, many test engineers and developers still do not fully understand the benefits of boundary scan test. The misconceptions ...
As more new processors and communication electronics are designed to include boundary-scan chains, boundary-scan testing of multiple circuit boards in parallel is becoming a way to cut both time and ...
At Alcatel-Lucent, we test chassis-level products that provide 42 board slots on a midplane, essentially a passive backplane that accepts boards on its front and rear sides. Thirty-four of those slots ...
Boundary-scan test and device programming vendor ASSET InterTech (Richardson, Texas) claims that the time it takes first-time and occasional users to develop a functional JTAG test, or to reach ...
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