Alternatively, you may want to connect its inputs and output in parallel with IC1.C to increase its drive power to the transistor test circuit. IC1.A and IC1.B together with R2, R3 and C1 form an ...

There is a great deal of activity in wide bandgap (WBG) power electronics lately, with Gallium Nitride (GaN) and Silicon Carbide (SiC) devices getting a lot of attention due to the technologies’ ...

The circuit has been constructed to provide an in-circuit system that will test the integrity of electronic components such as Silicon Controlled Rectifiers, diodes, and PNP or NPN transistors. 4093 – ...

Integrated circuit (IC) sizes continue to grow as they meet the compute requirements of cutting-edge applications such as artificial intelligence (AI), autonomous driving, and data centers. As design ...